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AIST-NT Smart (AFM)
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36
31
10:00 - AFM
13:00 - BFO PFM
1
9:00 - IVAN SAMPLE (Resistance measurements)
2
9:00 - CdS films 50C
13:00 - BFO PFM
3
9:00 - CAFM SiOx
4
9:00 - CdSSe0.25 50C
5
6
37
7
8
8:00 - PFM measurements
9
9:00 - CdSSe 0.5 50°C
13:00 - BFO PFM
10
9:00 - CAFM SiOx
11
9:30 - AFM SiOx Cu Ag
14:00 - Ivan AFM Topo BTO on Pt by hydrothermal
12
13
38
14
10:30 - AFM step Cu
15
9:00 - CdSSe films 50C
16
9:00 - IVAN SAMPLE
14:00 - Topography PoSi
17
9:00 - BaTiO3 sample
18
9:00 - Cu Step PoSi AFM
19
20
39
21
22
9:00 - Topography porouse Silicon AFM
23
9:00 - BaTiO3 SAMPLE AFM
24
9:00 - CdSSe x0.25 50°C
25
9:00 - BaTiO3 SAMPLE AFM
13:00 - SiOx Topography (different thicknesses)
26
27
40
28
29
9:30 - CdSSe 75°C
30
9:00 - PoSi Topography
1
9:00 - BTO on STO sample H.W
2
3
4
[Language: en] [Timezone: America/Montreal]