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AIST-NT Smart (AFM)
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September 2015
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39
21
22
9:00 - Topography porouse Silicon AFM
23
9:00 - BaTiO3 SAMPLE AFM
24
9:00 - CdSSe x0.25 50°C
25
9:00 - BaTiO3 SAMPLE AFM
13:00 - SiOx Topography (different thicknesses)
26
27
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